This electron gun is a special version high energy small spot electron source for gas phase electron diffraction (GED) applications
Energy range 1 keV to 60 keV
Beam size (min.) 50 µm at low current
Beam current (max.) 50µA at larger beam diameters
Working distance 350 mm
Basic beam blanking
The unique design of STAIB’s electron sources has several advantages over the classic triode gun configuration.
Beam blanking is one such advantage. The beam can be switched on and off electrically, using a manual switch, controlling electron extraction from the filament. This method avoids the generation of stray electrons.
Additionally the full beam blanking option is available. Here the electron beam can be turned on and off using a BNC input via a TTL type input.
The full beam blanking option can be used to keep the electron load on the sample very low. The electron bombardment of sensitive surfaces can be kept to a minimum. The blanking signal can also be triggered synchronously with external signals to improve the use of the electron source in the presence of stray magnetic fields by compensating their effect. The external trigger can also be utilized to synchronize with rotating samples, which is important for in-situ monitoring in some deposition techniques.
The computer control option for STAIB electron guns consists of two parts.
1: Power supply computer control plug
The electron source power is equipped with an optional computer connection plug for analog control signals. The control voltages can either be provided by 3rd party software through a suitable DAC interface, or by the STAIB computer control module. The electron source system can either be operated using the manual control dials, or by using the optional computer control.
2: STAIB computer control module
The computer control option provides the cables, and microprocessor interface to connect to the computer control plug. The STAIB software sends the input signals to the power supply to control the various system functions. Full parameter sets can be stored, modified, and reused. The advanced version of the STAIB source controller can retrieve and copy the adjusted values from the manual control dials, providing the user with a to date unknown ease of use.
The option runs under the WindowsTM XP, WindowsTM 7, WindowsTM 10 operating system, using a USB connection.
An Improved Gas Electron Diffractometer – The Instrument, Data Collection, Reduction and Structure Refinement Procedure, R. J. F. Berger, M. Hoffmann, S. A. Hayes, N. W. Mitzel, Z. Naturforsch. 2009, 64b, 1259
Recent Developments of the GED Experiment at Moscow State University, A. M. Makurenkov et al., 14th European Symposium on gas phase electron diffraction, June 24-28, Moscow
Not all parameters can be reached simultaneously. Above specifications may change without notice.
Pictures / diagrams for reference only.