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STAIB INSTRUMENTS NEWSLETTER

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  2. STAIB INSTRUMENTS NEWSLETTER
STAIB INSTRUMENTS NEWSLETTEROliverToon2017-03-27T13:16:55+02:00

Products

  • RHEED
  • AUGER / XPS / EELS / REELS
  • Electron Sources
  • Ion Sources
  • X-ray Source
  • Energy Analyzers & Imaging Energy Filters
  • Charged Particle Detectors
  • PEEM & IEEM
  • UHV-Systems for Surface Analysis
  • Packages for Surface Analysis
  • Data Acquisition & Instrument Control Software

Applications

  • In situ Characterization
  • Surface Analysis Techniques
  • Material Growth Monitoring
  • Electron Diffraction
  • Scanning Electron Microscopy
  • Photoelectron Microscopy (PEEM)
  • Depth Profiling
  • Space Environment Simulation
  • Surface & Materials Modification

Products

  • RHEED
  • AUGER / XPS / EELS / REELS
  • Electron Sources
  • Ion Sources
  • X-ray Source
  • Energy Analyzers & Imaging Energy Filters
  • Charged Particle Detectors
  • PEEM & IEEM
  • UHV-Systems for Surface Analysis
  • Packages for Surface Analysis
  • Data Acquisition & Instrument Control Software

Applications

  • In situ Characterization
  • Surface Analysis Techniques
  • Material Growth Monitoring
  • Electron Diffraction
  • Scanning Electron Microscopy
  • Photoelectron Microscopy (PEEM)
  • Depth Profiling
  • Space Environment Simulation
  • Surface & Materials Modification

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  • Contact
  • Jobs

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