This electron source provides a high beam current at low beam energies as needed for dissociation, ionization, excitation, and charge neutralization. This model has scanning capability.
Energy range 1 eV – 100 eV
Beam current (max.) 100 μA
Beam size (min.) 2 mm at max energy and 21 mm working distance
Working Distance (WD) 15 mm – 50 mm
Optimum WD 21 mm nominal
Basic beam blanking
The unique design of STAIB’s electron sources has several advantages over the classic triode gun configuration.
Beam blanking is one such advantage. The beam can be switched on and off electrically, using a manual switch, controlling electron extraction from the filament. This method avoids the generation of stray electrons.
The computer control option for STAIB electron guns consists of two parts.
1: Power supply computer control plug
The electron source power supply is equipped with an optional computer connection plug for use with analog control signals. The electron source system can either be operated by using the manual control dials, or by using the optional computer control. The control voltages can either be provided by 3rd party software through a suitable DAC interface, or by the STAIB computer control module.
2: STAIB computer control module
The STAIB computer control option includes the cables and microprocessor interface to connect to the power supply computer control plug. The STAIB software sends the input signals to the power supply to control the system functions. Full parameter sets can be stored, modified, and reused. The advanced version of the STAIB computer control module can retrieve and copy the adjusted values from the manual control dials, providing the user with previously unavailable ease of use.
The option runs under the WindowsTM XP, WindowsTM 7, WindowsTM 10 operating systems, using a USB connection.
STAIB Instruments electron sources can be equipped with magnetic shielding. The shielding may be necessary because a magnetic field influences the electron beam. A static or DC magnetic field will shift the beam and an alternating field will wobble the beam. This can cause fluctuations in beam position, size and current.
The magnetic shielding is made of a highly ferromagnetic material. For this reason, it can be used to shield low frequency magnetic fields from the surrounding environment.
STAIB Instruments offers Scanning Electron Microscopy (SEM) products designed around our electron sources.
For beam diameters below ca. 10 microns, bright and detailed images of the sample are obtained in SEM mode. A number of specific electron guns covering a wide range of beam diameters and energies are available.
The elements of the system are:
Electron gun and power supply
Any of our microfocus sources may be used. Other STAIB electron sources may be used if higher lateral resolution is not needed.